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Frontiers in Optical Methods: Nano-Characterization and Coherent Control by Shin-Ya Ohno, Ikufumui Katayama, Ken-ichi Shudo (Hardcover, 2013)
BOOKS etc. (528418)
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About this product
Product Information
This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan.Product Identifiers
PublisherSpringer-Verlag Berlin AND Heidelberg Gmbh & Co. KG
ISBN-139783642405938
eBay Product ID (ePID)176283822
Product Key Features
Number of Pages228 Pages
Publication NameFrontiers in Optical Methods: Nano-Characterization and Coherent Control
LanguageEnglish
SubjectChemistry, Science, Physics
Publication Year2013
TypeTextbook
Subject AreaNanotechnology, Manufacturing Engineering
AuthorShin-Ya Ohno, Ikufumui Katayama, Ken-Ichi Shudo
SeriesSpringer Series in Optical Sciences
FormatHardcover
Dimensions
Item Height235 mm
Item Weight4853 g
Item Width155 mm
Volume180
Additional Product Features
EditorShin-Ya Ohno, Ken-Ichi Shudo, Ikufumui Katayama
Country/Region of ManufactureGermany
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