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Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks by Sam Boggs Jr., David H. Krinsley, Kenneth Pye and N. Keith Tovey (1998, Hardcover)
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The_Book_Fountain (184957)
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About this product
Product Identifiers
PublisherCambridge University Press
ISBN-100521453461
ISBN-139780521453462
eBay Product ID (ePID)96046477
Product Key Features
Number of Pages203 Pages
Publication NameBackscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
LanguageEnglish
Publication Year1998
SubjectEarth Sciences / Sedimentology & Stratigraphy, Electron Microscopes & Microscopy, Earth Sciences / Geology, Earth Sciences / General
TypeTextbook
AuthorSam Boggs Jr., David H. Krinsley, Kenneth Pye, N. Keith Tovey
Subject AreaScience
FormatHardcover
Dimensions
Item Height0.7 in
Item Weight27.7 Oz
Item Length8.2 in
Item Width10.3 in
Additional Product Features
Intended AudienceScholarly & Professional
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