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Vintage Digital Circuit Testing Francis C. Wang - e776
US $80.00
ApproximatelyS$ 102.90
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Condition:
Very Good
A book that has been read but is in excellent condition. No obvious damage to the cover, with the dust jacket included for hard covers. No missing or damaged pages, no creases or tears, and no underlining/highlighting of text or writing in the margins. May be very minimal identifying marks on the inside cover. Very minimal wear and tear.
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US $9.05 (approx S$ 11.64) USPS Ground Advantage®.
Located in: Marysville, Washington, United States
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eBay item number:396476091469
Item specifics
- Condition
- ISBN
- 9780127345802
About this product
Product Identifiers
Publisher
Elsevier Science & Technology
ISBN-10
0127345809
ISBN-13
9780127345802
eBay Product ID (ePID)
31751
Product Key Features
Number of Pages
228 Pages
Publication Name
Digital Circuit Testing : a Guide to Dft and Other Techniques
Language
English
Subject
Industrial Design / Product, Electronics / Circuits / General, Electronics / Digital
Publication Year
1991
Type
Textbook
Subject Area
Technology & Engineering
Format
Hardcover
Dimensions
Item Height
0.3 in
Item Weight
21.3 Oz
Item Length
9.3 in
Item Width
6.3 in
Additional Product Features
Intended Audience
Scholarly & Professional
LCCN
90-029033
Reviews
"The text, Digital Circuit Testing: A Guide to DFT and Other Techniqueslt;/b>, introduces the reader to the whole spectrum of digital test technology, covering some facets in more detail than others....This book is intended to be an introduction to straight-forward testing techniques, easily applicable to the daily work of design and test engineers or as a course or reference text. The author accomplishes his purpose succinctly and in an easy-to-understand style." --IEEE, INSTRUMENTATION AND MEASUREMENT SOCIETY NEWSLETTER, "The text, Digital Circuit Testing: A Guide to DFT and Other Techniques , introduces the reader to the whole spectrum of digital test technology, covering some facets in more detail than others....This book is intended to be an introduction to straight-forward testing techniques, easily applicable to the daily work of design and test engineers or as a course or reference text. The author accomplishes his purpose succinctly and in an easy-to-understand style." --IEEE, INSTRUMENTATION AND MEASUREMENT SOCIETY NEWSLETTER
Dewey Edition
20
Illustrated
Yes
Dewey Decimal
621.381/5
Table Of Content
A Test Generation Method Using Testability Results. Circuit ATVG and DFT. PLD Design for Test. Built-In Self Test and Boundary Scan Techniques. ATE and the Testing Process. Special Testing Topics and Conclusions. Index.
Synopsis
Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
LC Classification Number
TK7874.W363 1991
Item description from the seller
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Seller feedback (363)
- l***f (875)- Feedback left by buyer.Past monthVerified purchaseNice transaction, all as promised quickly
- t***n (850)- Feedback left by buyer.Past monthVerified purchaseShipping was super-fast and at a low cost. Packaged with care and the item was just as described. Thanks so much! Great seller!!
- a***7 (1728)- Feedback left by buyer.Past monthVerified purchaseGreat seller thank you