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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents by Ad
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Located in: Fairfield, Ohio, United States
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eBay item number:395157057835
Item specifics
- Condition
- Brand New: A new, unread, unused book in perfect condition with no missing or damaged pages. See all condition definitionsopens in a new window or tab
- ISBN-13
- 9781441923066
- Book Title
- Scanning Probe Microscopy
- ISBN
- 9781441923066
- Subject Area
- Technology & Engineering, Science
- Publication Name
- Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents
- Item Length
- 9.3 in
- Publisher
- Springer New York
- Subject
- Nanoscience, Materials Science / General, Electron Microscopes & Microscopy, Nanotechnology & Mems
- Publication Year
- 2010
- Series
- Nanoscience and Technology Ser.
- Type
- Textbook
- Format
- Trade Paperback
- Language
- English
- Item Width
- 6.1 in
- Item Weight
- 16.1 Oz
- Number of Pages
- Xiv, 282 Pages
About this product
Product Information
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today's simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today's research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.
Product Identifiers
Publisher
Springer New York
ISBN-10
1441923063
ISBN-13
9781441923066
eBay Product ID (ePID)
109176802
Product Key Features
Publication Name
Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents
Format
Trade Paperback
Language
English
Subject
Nanoscience, Materials Science / General, Electron Microscopes & Microscopy, Nanotechnology & Mems
Publication Year
2010
Series
Nanoscience and Technology Ser.
Type
Textbook
Subject Area
Technology & Engineering, Science
Number of Pages
Xiv, 282 Pages
Dimensions
Item Length
9.3 in
Item Width
6.1 in
Item Weight
16.1 Oz
Additional Product Features
Intended Audience
Scholarly & Professional
Number of Volumes
1 Vol.
Lc Classification Number
Ta418.5-.84
Table of Content
The Physics of Scanning Probe Microscopes.- SPM: The Instrument.- Theory of Forces.- Electron Transport Theory.- Transport in the Low Conductance Regime.- Bringing Theory to Experiment in SFM.- Topographic images.- Single-Molecule Chemistry.- Current and Force Spectroscopy.- Outlook.
Copyright Date
2006
Dewey Decimal
502.82
Dewey Edition
22
Illustrated
Yes
Item description from the seller
Seller assumes all responsibility for this listing.
eBay item number:395157057835
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Item location:
Fairfield, Ohio, United States
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