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Inside NAND Flash Memories by Rino Micheloni (English) Hardcover Book
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Located in: Fairfield, Ohio, United States
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eBay item number:395142215621
Item specifics
- Condition
- Brand New: A new, unread, unused book in perfect condition with no missing or damaged pages. See all condition definitionsopens in a new window or tab
- ISBN-13
- 9789048194308
- Book Title
- Inside NAND Flash Memories
- ISBN
- 9789048194308
- Subject Area
- Computers, Technology & Engineering, Science
- Publication Name
- Inside Nand Flash Memories
- Item Length
- 9.3 in
- Publisher
- Springer Netherlands
- Subject
- Spectroscopy & Spectrum Analysis, Chemistry / Analytic, Electronics / Circuits / General, General
- Publication Year
- 2010
- Type
- Textbook
- Format
- Hardcover
- Language
- English
- Item Width
- 6.1 in
- Item Weight
- 78 Oz
- Number of Pages
- X, 582 Pages
About this product
Product Information
Here is a comprehensive guide of the NAND world: from circuits design to Flash reliability (including radiation effects), from testing issues to high-performance (DDR) interface, from error correction codes to NAND applications like Flash cards and SSDs.
Product Identifiers
Publisher
Springer Netherlands
ISBN-10
904819430x
ISBN-13
9789048194308
eBay Product ID (ePID)
21038751745
Product Key Features
Publication Name
Inside Nand Flash Memories
Format
Hardcover
Language
English
Subject
Spectroscopy & Spectrum Analysis, Chemistry / Analytic, Electronics / Circuits / General, General
Publication Year
2010
Type
Textbook
Subject Area
Computers, Technology & Engineering, Science
Number of Pages
X, 582 Pages
Dimensions
Item Length
9.3 in
Item Width
6.1 in
Item Weight
78 Oz
Additional Product Features
LCCN
2010-931597
Intended Audience
Scholarly & Professional
Number of Volumes
1 Vol.
Lc Classification Number
Tk7867-7867.5
Table of Content
Preface. Acknowledgements. 1 Market and applications for NAND flash memories; Gregory Wong. 2 NAND overview: from memory to systems; R. Micheloni, A. Marelli and S. Commodaro. 3 Program and erase of NAND memory arrays; Cristoph Friederich. 4 Reliability issues of NAND flash memories; C. Zambelli, A. Chimenton and P. Olivo. 5 Charge trap NAND technologies ; Alessandro Grossi. 6 Control logic; A. Marelli, R. Micheloni and R. Ravasio. 7 NAND DDR interface; Andrea Silvagni. 8 Sensing circuits; L. Crippa and R. Micheloni. 9 Parasitic effects and verify circuits; L. Crippa and R. Micheloni. 10 MLC storage; L. Crippa and R. Micheloni. 11 Charge pumps, voltage regulators and HV switches; R. Micheloni and L. Crippa. 12 High voltage overview; R. Micheloni and A. Marelli. 13 Redundancy; A. Marelli and R. Micheloni . 14 Error correction codes; T. Zhang, A. Marelli and R. Micheloni. 15 NAND design for testability and testing; Andrea Silvagni. 16 XLC storage; R. Micheloni and L. Crippa. 17 Flash cards; A. Ghilardelli and S. Corno. 18 Low power 3D-integrated SSD; K. Takeuchi. 19 Radiation effects on NAND Flash memories; M. Bagatin, G. Cellere, S. Gerardin and A. Paccagnella. About the authors. Index.
Copyright Date
2010
Dewey Decimal
004.5
Dewey Edition
22
Illustrated
Yes
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eBay item number:395142215621
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Fairfield, Ohio, United States
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