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Near Field Emission Scanning Electron Microscopy by Taryl L. Kirk (English) Pape
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eBay item number:387196193747
Item specifics
- Condition
- Brand New: A new, unread, unused book in perfect condition with no missing or damaged pages. See all condition definitionsopens in a new window or tab
- ISBN-13
- 9783832525187
- Book Title
- Near Field Emission Scanning Electron Microscopy
- ISBN
- 9783832525187
About this product
Product Identifiers
Publisher
Logos Verlag Berlin
ISBN-10
3832525181
ISBN-13
9783832525187
eBay Product ID (ePID)
237633728
Product Key Features
Number of Pages
97 Pages
Language
English
Publication Name
Near Field Emission Scanning Electron Microscopy
Publication Year
2010
Subject
General, Physics / General, Chemistry / General
Type
Textbook
Subject Area
Technology & Engineering, Science
Series
Applied Electron Microskopy-Angewandte Elektronenmikroskopie Ser.
Format
Trade Paperback
Dimensions
Item Weight
4.5 Oz
Item Length
8.3 in
Item Width
5.7 in
Additional Product Features
Intended Audience
College Audience
Series Volume Number
9
Synopsis
Low beam energies have been implemented in a simplified SEM technique; where the electron source, remote in standard SEMs, is brought within tens of nanometers to the object. This method, known as the "near field emission scanning electron microscopy" (NFESEM), is capable of imaging conducting surfaces with nanometer resolution using beam energies less than 60 eV. The terminology "near" refers to the locality of the field-emitted electron source; which is to distinguish itself from the "remote" field emission gun sources used in standard SEMs. The main aim of this instrument is the realization of some kind of surface topography image due to the exposure of a primary beam of electrons, as it is rastered along the sample surface. This will be achieved by two distinct (although related) experiments: measuring the field emission (FE) current while scanning and detecting the secondary electrons (SE)s generated when the electron beam impinges on the surface. Here, the FE properties, in accordance with the tip-sample separation, will be emphasized, since the variations in SE yield are directly proportional to the impinging primary electron beam. We observe a direct correlation between the image contrast and the FE current, where the image is enhanced with increasing FE current. Moreover, simple electrostatic measurements can be used to define the performance of the device.
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Seller feedback (1,055,120)
- o***i (2916)- Feedback left by buyer.Past monthVerified purchaseItem As Described! New Condition! Fast Shipping! Entertaining Book!!! Smooth Transaction!
- n***d (1363)- Feedback left by buyer.Past monthVerified purchaseQuick shipping, great service, well done!
- t***t (1659)- Feedback left by buyer.Past monthVerified purchaseSlow shipping. As described