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Rino Micheloni Luca Crippa Alessia M Inside NAND Flash Me (Hardback) (UK IMPORT)

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eBay item number:364751739233
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Item specifics

Condition
Brand New: A new, unread, unused book in perfect condition with no missing or damaged pages. See all condition definitionsopens in a new window or tab
Book Title
Inside NAND Flash Memories
Title
Inside NAND Flash Memories
EAN
9789048194308
ISBN
9789048194308
Genre
Science Nature & Math
Subject
Spectroscopy & Spectrum Analysis, Chemistry / Analytic, Electronics / Circuits / General, General
Release Date
08/18/2010
Release Year
2010
Country/Region of Manufacture
NL
Item Height
235mm
Subject Area
Computers, Technology & Engineering, Science
Publication Name
Inside Nand Flash Memories
Item Length
9.3 in
Publisher
Springer Netherlands
Publication Year
2010
Type
Textbook
Format
Hardcover
Language
English
Author
Rino Micheloni, Luca Crippa, Alessia Marelli
Item Width
6.1 in
Item Weight
78 Oz
Number of Pages
X, 582 Pages

About this product

Product Information

Here is a comprehensive guide of the NAND world: from circuits design to Flash reliability (including radiation effects), from testing issues to high-performance (DDR) interface, from error correction codes to NAND applications like Flash cards and SSDs.

Product Identifiers

Publisher
Springer Netherlands
ISBN-10
904819430x
ISBN-13
9789048194308
eBay Product ID (ePID)
21038751745

Product Key Features

Author
Rino Micheloni, Luca Crippa, Alessia Marelli
Publication Name
Inside Nand Flash Memories
Format
Hardcover
Language
English
Subject
Spectroscopy & Spectrum Analysis, Chemistry / Analytic, Electronics / Circuits / General, General
Publication Year
2010
Type
Textbook
Subject Area
Computers, Technology & Engineering, Science
Number of Pages
X, 582 Pages

Dimensions

Item Length
9.3 in
Item Width
6.1 in
Item Weight
78 Oz

Additional Product Features

LCCN
2010-931597
Intended Audience
Scholarly & Professional
Number of Volumes
1 Vol.
Lc Classification Number
Tk7867-7867.5
Table of Content
Preface. Acknowledgements. 1 Market and applications for NAND flash memories; Gregory Wong. 2 NAND overview: from memory to systems; R. Micheloni, A. Marelli and S. Commodaro. 3 Program and erase of NAND memory arrays; Cristoph Friederich. 4 Reliability issues of NAND flash memories; C. Zambelli, A. Chimenton and P. Olivo. 5 Charge trap NAND technologies ; Alessandro Grossi. 6 Control logic; A. Marelli, R. Micheloni and R. Ravasio. 7 NAND DDR interface; Andrea Silvagni. 8 Sensing circuits; L. Crippa and R. Micheloni. 9 Parasitic effects and verify circuits; L. Crippa and R. Micheloni. 10 MLC storage; L. Crippa and R. Micheloni. 11 Charge pumps, voltage regulators and HV switches; R. Micheloni and L. Crippa. 12 High voltage overview; R. Micheloni and A. Marelli. 13 Redundancy; A. Marelli and R. Micheloni . 14 Error correction codes; T. Zhang, A. Marelli and R. Micheloni. 15 NAND design for testability and testing; Andrea Silvagni. 16 XLC storage; R. Micheloni and L. Crippa. 17 Flash cards; A. Ghilardelli and S. Corno. 18 Low power 3D-integrated SSD; K. Takeuchi. 19 Radiation effects on NAND Flash memories; M. Bagatin, G. Cellere, S. Gerardin and A. Paccagnella. About the authors. Index.
Copyright Date
2010
Dewey Decimal
004.5
Dewey Edition
22
Illustrated
Yes

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