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Design for Testability, Debug and Reliability: Next Generation Measures Using
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Located in: Sparks, Nevada, United States
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Estimated between Thu, 30 May and Mon, 3 Jun to 43230
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eBay item number:364409924147
Item specifics
- Condition
- Brand New: A new, unread, unused book in perfect condition with no missing or damaged pages. See all condition definitionsopens in a new window or tab
- Publication Date
- 2021-04-20
- Pages
- 164
- ISBN
- 9783030692087
- Publication Year
- 2021
- Format
- Hardcover
- Language
- English
- Book Title
- Design for Testability, Debug and Reliability : Next Generation Measures Using Formal Techniques
- Item Length
- 9.3in
- Publisher
- Springer International Publishing A&G
- Genre
- Technology & Engineering, Computers
- Topic
- Systems Architecture / General, Electronics / Circuits / General
- Item Width
- 6.1in
- Item Weight
- 16 Oz
- Number of Pages
- Xxi, 164 Pages
About this product
Product Information
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.
Product Identifiers
Publisher
Springer International Publishing A&G
ISBN-10
3030692086
ISBN-13
9783030692087
eBay Product ID (ePID)
3050424892
Product Key Features
Book Title
Design for Testability, Debug and Reliability : Next Generation Measures Using Formal Techniques
Format
Hardcover
Language
English
Topic
Systems Architecture / General, Electronics / Circuits / General
Publication Year
2021
Genre
Technology & Engineering, Computers
Number of Pages
Xxi, 164 Pages
Dimensions
Item Length
9.3in
Item Width
6.1in
Item Weight
16 Oz
Additional Product Features
Number of Volumes
1 Vol.
Lc Classification Number
Tk7895.E42
Table of Content
Introduction.- Integrated Circuits.- Formal Techniques.- Embedded Compression Architecture for Test Access Ports.- Optimization SAT-based Retargeting for Embedded Compression.- Reconfigurable TAP Controllers with Embedded Compression.- Embedded Multichannel Test Compression for Low-Pin Count Test.- Enhanced Reliability using Formal Techniques.- Conclusion and Outlook.
Copyright Date
2021
Dewey Decimal
621.3815
Dewey Edition
23
Illustrated
Yes
Item description from the seller
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eBay item number:364409924147
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Sparks, Nevada, United States
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