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NanoScience and Technology: Applied Scanning Probe Methods VIII : Scanning...

US $101.70
ApproximatelyS$ 130.78
Condition:
Brand New
    Postage:
    Free Expedited Shipping from outside US.
    Located in: Bangkok, Thailand
    Delivery:
    Estimated between Thu, 3 Oct and Thu, 10 Oct to 43230
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    Returns:
    30 days return. Buyer pays for return shipping.
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    Seller assumes all responsibility for this listing.
    eBay item number:362970018854
    Last updated on Nov 10, 2022 14:42:53 SGTView all revisionsView all revisions

    Item specifics

    Condition
    Brand New: A new, unread, unused book in perfect condition with no missing or damaged pages. See all condition definitionsopens in a new window or tab
    ISBN
    9783540740797
    EAN
    9783540740797
    Subject Area
    Technology & Engineering, Science
    Publication Name
    Applied Scanning Probe Methods VIII : Scanning Probe Microscopy Techniques
    Publisher
    Springer Berlin / Heidelberg
    Item Length
    9.3 in
    Subject
    Spectroscopy & Spectrum Analysis, Electron Microscopes & Microscopy, Chemistry / Physical & Theoretical, Nanotechnology & Mems, Microscopes & Microscopy
    Publication Year
    2008
    Series
    Nanoscience and Technology Ser.
    Type
    Textbook
    Format
    Hardcover
    Language
    English
    Item Height
    0.4 in
    Author
    H. Fuchs, Bharat Bhushan
    Item Weight
    33.5 Oz
    Item Width
    6.1 in
    Number of Pages
    Lix, 465 Pages

    Item description from the seller

    Joined Oct 2004