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ESD Testing : From Components to Systems, Hardcover by Voldman, Steven H., Li...
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Located in: Jessup, Maryland, United States
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eBay item number:354952444935
Item specifics
- Condition
- Book Title
- ESD Testing : From Components to Systems
- ISBN
- 9780470511916
- Publication Year
- 2016
- Type
- Textbook
- Format
- Hardcover
- Language
- English
- Publication Name
- Esd Testing : from Components to Systems
- Item Height
- 0.8in
- Item Length
- 9.7in
- Publisher
- Wiley & Sons, Incorporated, John
- Item Width
- 6.9in
- Item Weight
- 22.4 Oz
- Number of Pages
- 328 Pages
About this product
Product Information
With the evolution of semiconductor technology and global diversification of the semiconductor business, testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance. ESD Testing: From Components to Systems updates the reader in the new tests, test models, and techniques in the characterization of semiconductor components for ESD, EOS, and latchup. Key features: Provides understanding and knowledge of ESD models and specifications including human body model (HBM), machine model (MM), charged device model (CDM), charged board model (CBM), cable discharge events (CDE), human metal model (HMM), IEC 61000-4-2 and IEC 61000-4-5. Discusses new testing methodologies such as transmission line pulse (TLP), to very fast transmission line pulse (VF-TLP), and future methods of long pulse TLP, to ultra-fast TLP (UF-TLP). Describes both conventional testing and new testing techniques for both chip and system level evaluation. Addresses EOS testing, electromagnetic compatibility (EMC) scanning, to current reconstruction methods. Discusses latchup characterization and testing methodologies for evaluation of semiconductor technology to product testing. ESD Testing: From Components to Systems is part of the authors' series of books on electrostatic discharge (ESD) protection; this book will be an invaluable reference for the professional semiconductor chip and system-level ESD and EOS test engineer. Semiconductor device and process development, circuit designers, quality, reliability and failure analysis engineers will also find it an essential reference. In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, semiconductor testing and experimental work.
Product Identifiers
Publisher
Wiley & Sons, Incorporated, John
ISBN-10
0470511915
ISBN-13
9780470511916
eBay Product ID (ePID)
228461311
Product Key Features
Publication Name
Esd Testing : from Components to Systems
Format
Hardcover
Language
English
Publication Year
2016
Type
Textbook
Number of Pages
328 Pages
Dimensions
Item Length
9.7in
Item Height
0.8in
Item Width
6.9in
Item Weight
22.4 Oz
Additional Product Features
Lc Classification Number
Tk7870.285.V65 2016
Copyright Date
2017
Topic
Electronics / Semiconductors, Electronics / Circuits / Integrated, Electronics / Circuits / General
Lccn
2016-023736
Dewey Decimal
621.38154
Intended Audience
Scholarly & Professional
Dewey Edition
23
Genre
Technology & Engineering
Item description from the seller
Seller assumes all responsibility for this listing.
eBay item number:354952444935
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Seller feedback (342,017)
2***s (428)- Feedback left by buyer.
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Good book. Thank you
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Thank you!
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Item just as described and delivery was quick!