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Atom Probe Tomography - 9781461369219
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Item specifics
- Condition
- Brand New: A new, unread, unused book in perfect condition with no missing or damaged pages. See all condition definitionsopens in a new window or tab
- Book Title
- Atom Probe Tomography
- ISBN
- 9781461369219
- Subject Area
- Mechanical Engineering
- Publication Name
- Atom Probe Tomography: Analysis at the Atomic Level
- Publisher
- Springer-Verlag New York Inc.
- Subject
- Engineering & Technology
- Publication Year
- 2012
- Type
- Textbook
- Format
- Paperback
- Language
- English
- Item Height
- 244 mm
- Item Weight
- 462 g
- Item Width
- 170 mm
- Number of Pages
- 239 Pages
About this product
Product Information
The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.
Product Identifiers
Publisher
Springer-Verlag New York Inc.
ISBN-13
9781461369219
eBay Product ID (ePID)
149019048
Product Key Features
Number of Pages
239 Pages
Language
English
Publication Name
Atom Probe Tomography: Analysis at the Atomic Level
Publication Year
2012
Subject
Engineering & Technology
Type
Textbook
Subject Area
Mechanical Engineering
Format
Paperback
Dimensions
Item Height
244 mm
Item Weight
462 g
Item Width
170 mm
Additional Product Features
Country/Region of Manufacture
United States
Item description from the seller
Business seller information
Value Added Tax Number:
- GB 976952259
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