This listing was ended by the seller on Mon, 8 Jul at 2:45 PM because the item is no longer available.
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Scanning Electron Microscope

FEI Inspect with EDX and CL Detector
EUR 46,000.00
ApproximatelyS$ 66,291.70
or Best Offer
Condition:
Used
    Postage:
    Will post to United States. Read item description or contact seller for shipping options.
    Located in: Gumpoldskirchen, Austria
    Delivery:
    Varies
    Returns:
    No returns accepted.
    Coverage:
    Read item description or contact seller for details. See all detailsSee all details on coverage
    (Not eligible for eBay purchase protection programmes)
    Seller assumes all responsibility for this listing.
    eBay item number:296378959144
    Last updated on Apr 20, 2024 23:12:06 SGTView all revisionsView all revisions

    Item specifics

    Condition
    Used: An item that has been used previously. The item may have some signs of cosmetic wear, but is ...

    Item description from the seller

    Joined Jan 2003
    Usually responds within 24 hours