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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents: New
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Located in: Sparks, Nevada, United States
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eBay item number:282828826196
Item specifics
- Condition
- Brand New: A new, unread, unused book in perfect condition with no missing or damaged pages. See all condition definitionsopens in a new window or tab
- Book Title
- Scanning Probe Microscopy: Atomic Scale Engineering by Forces and
- Publication Date
- 2006-06-28
- Pages
- 282
- ISBN
- 9780387400907
- Series
- Nanoscience and Technology Ser.
- Publication Year
- 2006
- Type
- Textbook
- Format
- Hardcover
- Language
- English
- Publication Name
- Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents
- Item Length
- 9.3in
- Publisher
- Springer New York
- Item Width
- 6.1in
- Item Weight
- 46.2 Oz
- Number of Pages
- Xiv, 282 Pages
About this product
Product Information
Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today's simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will understand how simulations can be directly compared to experimental data. Key Features Serves as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopy Provides a framework for linking scanning probe theory and simulations with experimental data Written in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations
Product Identifiers
Publisher
Springer New York
ISBN-10
0387400907
ISBN-13
9780387400907
eBay Product ID (ePID)
48248759
Product Key Features
Publication Name
Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents
Format
Hardcover
Language
English
Series
Nanoscience and Technology Ser.
Publication Year
2006
Type
Textbook
Number of Pages
Xiv, 282 Pages
Dimensions
Item Length
9.3in
Item Width
6.1in
Item Weight
46.2 Oz
Additional Product Features
Number of Volumes
1 Vol.
Lc Classification Number
Ta418.5-.84
Table of Content
The Physics of Scanning Probe Microscopes.- SPM: The Instrument.- Theory of Forces.- Electron Transport Theory.- Transport in the Low Conductance Regime.- Bringing Theory to Experiment in SFM.- Topographic images.- Single-Molecule Chemistry.- Current and Force Spectroscopy.- Outlook.
Copyright Date
2006
Topic
Nanoscience, Materials Science / General, Electron Microscopes & Microscopy, Nanotechnology & Mems
Lccn
2005-936713
Dewey Decimal
502.8/2
Intended Audience
Scholarly & Professional
Dewey Edition
22
Illustrated
Yes
Genre
Technology & Engineering, Science
Item description from the seller
Seller assumes all responsibility for this listing.
eBay item number:282828826196
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Sparks, Nevada, United States
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