Picture 1 of 10










Gallery
Picture 1 of 10










Have one to sell?
YUSHI Dynamic Leeb Hardness Tester Probe G Type Impact Device NDT Testing
US $475.00
ApproximatelyS$ 616.84
Condition:
3 available
Oops! Looks like we're having trouble connecting to our server.
Refresh your browser window to try again.
Returns:
60 days return. Buyer pays for return shipping. If you use an eBay shipping label, it will be deducted from your refund amount.
Coverage:
Read item description or contact seller for details. See all detailsSee all details on coverage
(Not eligible for eBay purchase protection programmes)
Shop with confidence
About this item
Seller assumes all responsibility for this listing.
eBay item number:226846600977
Item specifics
- Condition
- Country of Origin
- China
- Brand
- YUSHI
- Gage Type
- Hardness Tester Probe
- Type
- Hardness
- Model
- G type
- MPN
- P-301-0004
- California Prop 65 Warning
- NO
- Unit Quantity
- 1
- Unit Type
- Unit
- UPC
- 700828572290
Item description from the seller
Seller feedback (532)
- l***a (224)- Feedback left by buyer.Past 6 monthsVerified purchaseExcellent seller. Item arrived exactly as described .YUSHI Ultrasonic Contact Transducer 0.5MHz 25mm BNC Connector (#226066059102)
- p***o (38)- Feedback left by buyer.Past monthVerified purchaseFast shipping, as described.
- o***c (435)- Feedback left by buyer.Past 6 monthsVerified purchasefast delivery, great sellerYUSHI 4MHz 8x9mm 45° 60° 70° Angle Beam Transducer for Ultrasonic Flaw Detector (#226846287760)

