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Analog and Mixed-Signal Test by Vinnakota, Bapiraju
by Vinnakota, Bapiraju | HC | VeryGood
Condition:
“May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend ”... Read moreabout condition
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Located in: Aurora, Illinois, United States
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Estimated between Wed, 22 May and Sat, 25 May to 43230
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eBay item number:196073488176
Item specifics
- Condition
- Very Good
- Seller Notes
- Binding
- Hardcover
- Weight
- 1 lbs
- Product Group
- Book
- IsTextBook
- Yes
- ISBN
- 9780137863105
- Publication Year
- 1998
- Type
- Textbook
- Format
- Hardcover
- Language
- English
- Publication Name
- Analog and Mixed-Signal Test
- Item Height
- 0.9in
- Item Length
- 9.3in
- Publisher
- Prentice Hall PTR
- Item Width
- 6.2in
- Item Weight
- 22.3 Oz
- Number of Pages
- 256 Pages
About this product
Product Information
A comprehensive guide to analog and mixed-signal IC testing. It reviews the potential testing options for analog and mixed-signal ICs, enabling designers, engineers, CAD developers and researchers to choose the most cost-effective, accurate solution. It outlines the state-of-the-art in analog testing.
Product Identifiers
Publisher
Prentice Hall PTR
ISBN-10
0137863101
ISBN-13
9780137863105
eBay Product ID (ePID)
474135
Product Key Features
Publication Name
Analog and Mixed-Signal Test
Format
Hardcover
Language
English
Publication Year
1998
Type
Textbook
Number of Pages
256 Pages
Dimensions
Item Length
9.3in
Item Height
0.9in
Item Width
6.2in
Item Weight
22.3 Oz
Additional Product Features
Lc Classification Number
Tk7874.A543 1998
Table of Content
List of Figure. List of Tables. Preface. Contributors. 1. Introduction. Motivation. History. Current Research. Influence of Digital Test. Analog Test Issues. Test Paradigms. Organization. Conclusion. 2. Defect-Oriented Testing. Introduction. Previous Work. Estimation Method. Topological Method. Taxonomical Method. Defect-Based Realistic Fault Dictionary. Implementation. A Case Study. Fault Matrix Generation. Stimuli Matrix. Simulation Results. Silicon Results. Observations and Analysis. IFA-based Fault Grading and DFT for Analog Circuits. A/D Converter Testing. Description of the Experiment. Fault Simulation Issues. Fault Simulation Results. Analysis. DFT Measures. High-Level Analog Fault Models. Discussion: Strengths and Weaknesses of IFA-Based Tests. 3. Fault Simulation. Introduction. Why Analog Fault Simulation? Analog Fault Models and What-if Analysis. Focus and Organization. Fault Simulation of Linear Analog Circuits. Householders Formula. Discrete Z-domain Mapping. Fault Bands and Band Faults. Interval-Mathematics Approach. Summary. C Fault Simulation of Nonlinear Analog Circuits. The Complementary Pivot Method. Fault Simulation via One-Step Relaxation. Simulation by Fault Ordering. Handling Statistical Variations. Summary. Fault Co-Simulation with Multiple Levels of Abstraction. Mixed-Signal Simulators. Incorporating Behavioral Models in Fault Simulation. Fault Macromodeling and Induced Behavioral Fault Modeling. Statistical Behavioral Modeling. Remarks on Hardware Description Languages. Concluding Remarks. 4. Automatic Test Generation Algorithms. Introduction. Fundamental Issues in Analog ATPG. Structural Test Versus Functional Test. Path Sensitization. Measurement Impact on Test Generation. Simulation Impact on Test Generation. Test Generation Algorithms and Results. Functional Test Generation Algorithms. Structural Test Generation Algorithms. ATPG Based on Automatic Test Selection Algorithms. DFT-based Analog ATPG Algorithms. Conclusions. 5. Design for Test. Preliminaries. Analog Characteristics. Common Characteristics. Generic Test Techniques. Increased Controllability/Observability. A/D Boundary Control. System-Specific Test Techniques. Analog Scan. Boundary Scan. Macro-Based DFT. Operational Amplifiers. Data Converters. Filters. Quality Analysis. Preliminaries. Analysis. Analysis. Conclusion. 6. Spectrum-Based Built-in Self-Test. Introduction. Some Early BIST Schemes. On-Chip Signal Generation. Digital Frequency Synthesis. Delta-Sigma Oscillators. Fixed-Length Periodic Bit Stream. Parameter Analysis. Fast Fourier Transform. Sinewave Correlation. Ba
Copyright Date
1998
Target Audience
College Audience
Topic
Electronics / Circuits / Integrated, Electronics / General
Lccn
98-004505
Dewey Decimal
621.3815
Dewey Edition
21
Genre
Technology & Engineering
Item description from the seller
Seller assumes all responsibility for this listing.
eBay item number:196073488176
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h***c (1804)- Feedback left by buyer.
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Good price and shipped quickly. Just what I was looking for. Recommended seller. Thanks!
h***c (1804)- Feedback left by buyer.
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Good price and shipped quickly. Just what I was looking for. Recommended seller. Thanks!
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Perfect condition dvd and fast shipping! Thank you!