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X-RAY MICROSCOPY: PROCEEDINGS OF THE SIXTH INTERNATIONAL By Werner Meyer-ilse
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Condition:
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A book that has been read but is in good condition. Very minimal damage to the cover including scuff marks, but no holes or tears. The dust jacket for hard covers may not be included. Binding has minimal wear. The majority of pages are undamaged with minimal creasing or tearing, minimal pencil underlining of text, no highlighting of text, no writing in margins. No missing pages.
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US $4.63 (approx S$ 5.95) USPS Media MailTM.
Located in: Decatur, Georgia, United States
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Estimated between Sat, 23 Aug and Thu, 28 Aug to 94104
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eBay item number:157065662771
Item specifics
- Condition
- Book Title
- X-Ray Microscopy: Proceedings of the Sixth International
- Item Height
- 9.21 inches
- ISBN-10
- 1563969262
- ISBN
- 9781563969263
About this product
Product Identifiers
Publisher
American Institute of Physics
ISBN-10
1563969262
ISBN-13
9781563969263
eBay Product ID (ePID)
1708065
Product Key Features
Number of Pages
Xx, 748 Pages
Publication Name
X-Ray Microscopy : Proceedings of the Sixth International Conference, Berkeley, CA, August 1999
Language
English
Subject
General, Microscopes & Microscopy, Astronomy, Physics / General
Publication Year
2000
Type
Textbook
Subject Area
Science, Medical
Series
Aip Conference Proceedings / Atomic, Molecular, Chemical Physics Ser.
Format
Hardcover
Dimensions
Item Weight
97.7 Oz
Item Length
9.4 in
Item Width
6.3 in
Additional Product Features
Intended Audience
Scholarly & Professional
LCCN
00-101916
Series Volume Number
507
Illustrated
Yes
Synopsis
This volume is the status report of the international community of practitioners of x-ray microscopy. It contains the reviews and work presented at the 6th International Conference on X-Ray Microscopy held in Berkeley, 2-6 August 1999. The techniques are being applied to biological imaging where, for example, special labeling can reveal the location of specific proteins in cells, while cryogenic sample handling prevents x-ray damage to cells. These techniques can also be used to analyze objects on a 10 nm size scale, allowing the study of their physical and chemical state. For example, chemical processes in the environment can be examined on the surfaces of microscopic particulate matter. The availability of several new soft x-ray synchrotron light sources around the world is facilitating the development of new applications. This conference showed that large new programs have become productive at these new synchrotron sources.
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