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Rietveld Refinement: Practical - Paperback, by Dinnebier Robert E. - Very Good
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Located in: Philadelphia, Pennsylvania, United States
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eBay item number:125331718684
Item specifics
- Condition
- Book Title
- Rietveld Refinement: Practical Powder Diffraction Pattern Analysi
- ISBN
- 9783110456219
- Subject Area
- Science
- Publication Name
- Rietveld Refinement : Practical Powder Diffraction Pattern Analysis Using Topas
- Publisher
- DE Gruyter Gmbh, Walter
- Item Length
- 9.4 in
- Subject
- Physics / Condensed Matter, Physics / Crystallography, Radiation, Earth Sciences / General, Physics / General
- Publication Year
- 2018
- Series
- De Gruyter Stem Ser.
- Type
- Textbook
- Format
- Trade Paperback
- Language
- English
- Item Weight
- 23.1 Oz
- Item Width
- 6.7 in
- Number of Pages
- 347 Pages
About this product
Product Information
Almost 50 years have passed since the famous papers of Hugo Rietveld from the late sixties where he describes a method for the refinement of crystal structures from neutron powder diffraction data. Soon after, the potential of the method for laboratory X-ray powder diffraction was discovered. Although the method is now widely accepted, there are still many pitfalls in the theoretical understanding and in practical daily use. This book closes the gap with a theoretical introduction for each chapter followed by a practical approach.The flexible macro type language of the Topas Rietveld software can be considered as the defacto standard.
Product Identifiers
Publisher
DE Gruyter Gmbh, Walter
ISBN-10
3110456214
ISBN-13
9783110456219
eBay Product ID (ePID)
240176331
Product Key Features
Number of Pages
347 Pages
Language
English
Publication Name
Rietveld Refinement : Practical Powder Diffraction Pattern Analysis Using Topas
Publication Year
2018
Subject
Physics / Condensed Matter, Physics / Crystallography, Radiation, Earth Sciences / General, Physics / General
Type
Textbook
Subject Area
Science
Series
De Gruyter Stem Ser.
Format
Trade Paperback
Dimensions
Item Weight
23.1 Oz
Item Length
9.4 in
Item Width
6.7 in
Additional Product Features
Intended Audience
Scholarly & Professional
LCCN
2018-954391
Reviews
"Dinnebier, Leineweber and Evans have done an outstanding job of explaining the fundamentals of the method and summarizing the exciting new developments. With this book, the reader can find answers to two questions: what information is stored in a powder diffraction pattern, and how to extract that information using TOPAS. I particularly like this combination of theory and practice and I wholeheartedly recommend this excellent read to any user of the powder diffraction method." Tomce Runcevski in: Journal of Applied Crystallography 52 (2019), https://doi.org/10.1107/S1600576719011178
Grade from
College Graduate Student
Illustrated
Yes
Grade to
College Graduate Student
Lc Classification Number
Qd945.D52 2019
Table of Content
- Basics of powder diffraction - The Rietveld formula - Whole Powder Pattern Fitting (Pawley, LeBail, Rietveld) - Concept of Convolution - Deriving the instrumental resolution function - Global versus local optimization - Structure determination - Fourier analysis - Isotropic and anisotropic microstructural properties - Rigid bodies, constraints, restraints - Sequential versus parametric Rietveld refinement - Symmetry and rotational modes - Modelling stacking faults - Quantitative phase analysis - Determination of amorphous content - Agreement factors - Macro programming
Copyright Date
2019
Item description from the seller
Seller assumes all responsibility for this listing.
eBay item number:125331718684
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